Film Thickness Measurement System SKOP
Affordable and simple film thickness measurement system using Ocean Optics spectrometers!
The SKOP (Starter Kit for Optical thickness measurement) optical film thickness measurement system measures the spectral reflectance of optical thin films and determines their thickness by analyzing the spectrum. The thin film on the substrate acts as an etalon, causing an interference pattern in the reflection spectrum. The spacing between the peaks of the sinusoidal pattern is correlated with the refractive index of the material and the thickness of the film. In SKOP, the interference pattern is analyzed using dedicated software to convert it into film thickness.
